An improved concept of minimum detectable limit in pesticide residue analysis

Abstract

A simple method for working out mimmum detectable limit of the conventional pesticide residue assays (colonmetry and microbioassay) has been proposed as sum total of lower measuring limit of an analytical instrument and sensitivity of a method. A conccpt of lowering the detectable limit of an method has been put forward. The concept of 't'sen (time to dissipate to the level of sensitivity) as been replaced by more logical 't'MDL (time dissipate to the level of minimum detectable limit)